Box 1
Container
Contains 73 Results:
Digital Instruments, Incorporated - “NanoScope Multimode Scanning Probe Microscope” - Sales Article, 1995 October
File — Box: 1, Folder: 21
Dates:
1995 October
Digital Instruments, Incorporated - NanoScope TappingMode Atomic Force Microscope - Brochure, undated
File — Box: 1, Folder: 22
Dates:
undated
Digital Instruments, Incorporated - “Phase Imaging: Beyond Topography” - Sales Article by K.L. Babcock and C.B. Prater, 1995 October
File — Box: 1, Folder: 23
Dates:
1995 October
Digital Instruments, Incorporated - “Probing Nano-Scale Forces with the Atomic Force Microscope” - Sales Article by C.B. Prater, P.G. Maivald, K.J. Kjoller, M.G. Heaton, 1995 October
File — Box: 1, Folder: 24
Dates:
1995 October
Digital Instruments, Incorporated - “Scanning Capacitance Microscopy for Carrier Profiling in Semiconductors” - Sales Article by A.N. Erickson, D.M. Adderton, Y.E. Strausser, R.J. Tench, 1996 September
File — Box: 1, Folder: 25
Dates:
1996 September
Digital Instruments, Incorporated - Scanning Probe Microscopes - Sales Booklet, 1995 March
File — Box: 1, Folder: 26
Dates:
1995 March
Digital Instruments, Incorporated - StandAlone Atomic Force Microscope - Brochure, undated
File — Box: 1, Folder: 27
Dates:
undated
Digital Instruments, Incorporated - “Studies of Polymer Surfaces with Atomic Force Microscopy” - Sales Article by Sergei Magonov, 1998 October
File — Box: 1, Folder: 28
Dates:
1998 October
Digital Instruments, Incorporated - “TappingMode Imaging Applications and Technology” - Sales Article by C.B. Prater, P.G. Maivald, K.J. Kjoller, M.G. Heaton, undated
File — Box: 1, Folder: 29
Dates:
undated
Digital Instruments, Incorporated - “Tip Evaluation for NanoScope Atomic Force Microscopes” - Sales Article by J.J. Mosley and M.G. Heaton, 1998 May
File — Box: 1, Folder: 30
Dates:
1998 May