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181. Xiao, C., F. Hagelberg, and W.A. Lester, Jr., “Geometric, Energetic, and Bonding Properties of Neutral and Charged Copper-Doped Silicon Clusters,” Physical Review B 66 (2002): 075425-1-075425-23., 2002

 File — Box: 58, Folder: 15

Dates

  • Creation: 2002

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